Weighing mainstream and alternative accounts…
Two lenses on the same evidence. Source weight and the primary source ratio show what each rests on.
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Investigated
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In electronic engineering, circuit-level failure modes are ways a circuit or its components can fail to deliver intended behavior—such as open or short faults, timing or functional errors, and harmful system effects. In mechanistic interpretability, the analogous concern is that a discovered neural-network circuit may not faithfully explain the model’s computation. The practical question is therefore whether you mean physical circuit reliability or model-explanation reliability; each requires different tests and failure classifications.
Two lenses on the same evidence. Source weight and the primary source ratio show what each rests on.
Lens adapted to this topic: Neural-network circuits and explanation failure
In mechanistic interpretability, “circuit-level failure” is not usually a hardware fault. It refers to an explanation failing to be faithful, localized, minimal, or causally adequate: a selected subgraph may reproduce behavior only under a particular ablation method, omit distributed computation, or correlate with rather than implement the behavior. This is an active methodological debate rather than a settled taxonomy.
Deeper threads worth pulling on next.